An impedance and power flow measurement system suitable for on-wafer microwave device large-signal characterization.
| Autor: | El-Deeb, Walid S.1 wseldeeb@ucalgary.ca, Bensmida, Souheil1, Boulejfen, Noureddine1,2, Ghannouchi, Fadhel M.1 |
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| Zdroj: | International Journal of RF & Microwave Computer-Aided Engineering. May2010, Vol. 20 Issue 3, p306-312. 7p. 1 Color Photograph, 3 Diagrams, 10 Charts. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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