Effects of composition on dislocation microstructure and stress in Si-doped Al x Ga1−x N

Autor: Manning, I.C.1, Weng, X.2, Fanton, M.A.3, Snyder, D.W.3, Redwing, J.M.1,2 jmr31@psu.edu
Zdroj: Journal of Crystal Growth. Apr2010, Vol. 312 Issue 8, p1301-1306. 6p.
Databáze: Academic Search Ultimate