Contrast inversion in nc-AFM on Si(111)7x7 due to short-range electrostatic interactions.
| Autor: | Guggisberg, M., Pfeiffer, O., Schär, S., Barwich, V., Bammerlin, M., Loppacher, C., Bennewitz, R., Baratoff, A., Meyer, E. |
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| Zdroj: | Applied Physics A: Materials Science & Processing. 2001, Vol. 72 Issue 7, pS19. 4p. |
| Databáze: | Academic Search Ultimate |
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