Model based precision structural measurements on barely resolved objects.

Autor: BADDELEY, D.1,2 d.baddeley@auckland.ac.nz, WEILAND, Y.1, BATRAM, C.1, BIRK, U.1, CREMER, C.1,3,4
Zdroj: Journal of Microscopy. Jan2010, Vol. 237 Issue 1, p70-78. 9p.
Databáze: Academic Search Ultimate