Self-correction of field-effect transistor characteristics in the mode of spontaneous space-charge ion polarization of gate oxide.

Autor: Zhdan, A. G.1, Naryshkina, V. G.1, Chucheva, G. V.1 gvc@ms.ire.rssi.ru
Zdroj: Semiconductors. May2009, Vol. 43 Issue 5, p677-679. 3p. 3 Graphs.
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