Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers.

Autor:	Lukyanchikova, N.1 natali@isp.kiev.ua, Garbar, N.1, Kudina, V.1 kudinavaleriya@yahoo.com, Smolanka, A.1, Simoen, E.2 simoen@imec.be, Claeys, C.2,3 claeys@imec.be
Zdroj:	Semiconductor Physics, Quantum Electronics & Optoelectronics. 2008, Vol. 11 Issue 3, p203-208. 6p. 8 Graphs.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu