TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings.
| Autor: | Schnöller, J.1 jschnoel@mail.zserv.tuwien.ac.at, Franz, R.2, Mitterer, C.2, Hutter, H.1 |
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| Zdroj: | Analytical & Bioanalytical Chemistry. Apr2009, Vol. 393 Issue 8, p1857-1861. 5p. 2 Diagrams, 1 Chart, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
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