Study of thermal effects and self-heating phenomena in planar power SOI MOS transistors.
| Autor: | Chaplygin, Yu.1, Artamonova, E.1, Krasyukov, A.1, Krupkina, T.1 krupkina@dsd.miee.ru |
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| Zdroj: | Semiconductors. Dec2008, Vol. 42 Issue 13, p1522-1526. 5p. 1 Diagram, 4 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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