Advanced Defect Characterization by STEM Analysis.
| Autor: | Subramanian, Sam1 Sam.Subramanian@freescale.com, Rai, Raghaw, Kiem Ly, Chrastecky, Tony, Mulder, Randy, Harber, Kieth |
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| Zdroj: | Electronic Device Failure Analysis. May2008, Vol. 10 Issue 2, p20-28. 6p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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