Study of the relationship between the crystal structure of nanolayers and electrical properties in Al x Ga1− x As/In y Ga1− y As pseudobinary heterostructures by double-crystal X-ray diffraction.
Autor: | Imamov, R. M.1 imamov@ns.crys.ras.ru, Subbotin, I. A.1, Galiev, G. B.2 |
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Zdroj: | Crystallography Reports. Mar2008, Vol. 53 Issue 2, p183-186. 4p. 1 Diagram, 1 Chart, 2 Graphs. |
Databáze: | Academic Search Ultimate |
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