Study of the relationship between the crystal structure of nanolayers and electrical properties in Al x Ga1− x As/In y Ga1− y As pseudobinary heterostructures by double-crystal X-ray diffraction.

Autor: Imamov, R. M.1 imamov@ns.crys.ras.ru, Subbotin, I. A.1, Galiev, G. B.2
Zdroj: Crystallography Reports. Mar2008, Vol. 53 Issue 2, p183-186. 4p. 1 Diagram, 1 Chart, 2 Graphs.
Databáze: Academic Search Ultimate