VO2 thin films deposited on silicon substrates from V2O5 target: Limits in optical switching properties and modeling

Autor:	Saitzek, Sébastien1,2, Guinneton, Frédéric1, Guirleo, Guillaume1, Sauques, Laurent3, Aguir, Khalifa4, Gavarri, Jean-Raymond1 gavarri.jr@univ-tln.fr
Zdroj:	Thin Solid Films. Jan2008, Vol. 516 Issue 6, p891-897. 7p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect