Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction.

Autor: Du-Ming Tsai1 s929501@mail.yzu.edu.tw, Chih-Chia Kuo1
Zdroj: Machine Vision & Applications. Feb2008, Vol. 18 Issue 6, p383-400. 18p. 20 Black and White Photographs, 1 Diagram, 2 Graphs.
Databáze: Academic Search Ultimate