A WIP-based exception-management model for integrated circuit back-end production processes.

Autor: Ruey-Shan Guo1, Chiang, David M.1, Fan-Yun Pai1 d91741006@ntu.edu.tw
Zdroj: International Journal of Advanced Manufacturing Technology. Jul2007, Vol. 33 Issue 11/12, p1263-1274. 12p. 3 Diagrams, 8 Charts, 1 Graph.
Databáze: Academic Search Ultimate