Integral evaluation in semiconductor device modelling using simulated annealing with Bose–Einstein statistics.
| Autor: | Cole, E. A. B.1 e.a.b.cole@leeds.ac.uk |
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| Zdroj: | International Journal of Numerical Modelling. Jul/Aug2007, Vol. 20 Issue 4, p197-215. 19p. 1 Diagram, 3 Charts, 4 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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