BAST: BIST-aided scan test. A new method for test cost reduction.
| Autor: | Aikyo, Takashi1, Hiraide, Takahisa2, Emori, Michiaki1 |
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| Zdroj: | Electronics & Communications in Japan, Part 2: Electronics. May2007, Vol. 90 Issue 5, p58-65. 8p. 5 Charts, 9 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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