Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering.
| Autor: | Hendrich, C.1, Favre, L.1, Ievlev, D. N.1, Dobrynin, A. N.1, Bras, W.2, Hörmann, U.3, Piscopiello, E.3, Van Tendeloo, G.3, Lievens, P.1 peter.lievens@fys.kuleuven.be, Temst, K.1 |
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| Zdroj: | Applied Physics A: Materials Science & Processing. Mar2007, Vol. 86 Issue 4, p533-538. 6p. 1 Chart, 4 Graphs. |
| Databáze: | Academic Search Ultimate |
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