Gabor filtering for feature extraction on complex images: application to defect detection on semiconductors.
| Autor: | Bourgeat, P.1,2, Meriaudeau, F.2 f.meriaudeau@iutlecreusot.u-bourgogne.Fr, Tobin, K. W.1, Gorriab, P.2 |
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| Zdroj: | Imaging Science Journal. 2006, Vol. 54 Issue 4, p200-210. 11p. 3 Color Photographs, 3 Diagrams, 4 Graphs. |
| Databáze: | Academic Search Ultimate |
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