Structural localization of trace amounts of impurity ions in Langmuir-Blodgett films by the X-ray standing wave method.

Autor:	Novikova, N. N.1 nn_novikova@ns.crys.ras.ru, Zheludeva, S. I.1, Stepina, N. D.1, Tolstikhina, A. L.1, Gaĭnutdinov, R. V.1, Erko, A. I.2, Haase, W.3, Galyametdinov, Yu. G.4
Zdroj:	Crystallography Reports. Nov2006, Vol. 51 Issue 6, p1041-1047. 7p. 6 Graphs.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu