Genetic algorithm for solution of the inverse problem in high-resolution X-ray reflectometry.

Autor: Sutyrin, A. G.1 sutyrin@ns.crys.ras.ru, Prokhorov, D. Yu.1
Zdroj: Crystallography Reports. Jul2006, Vol. 51 Issue 4, p570-576. 7p. 1 Diagram, 6 Graphs.
Databáze: Academic Search Ultimate