Transmission electron microscopy analysis of phase separation in GaInAsSb films grown on GaSb substrate.

Autor: SZCZESZEK, P.1, AMARIEI, A.1, SCHÖNE, J.1, ZOULIS, G.1, VOUROUTZIS, N.1, POLYCHRONIADIS, E. K. polychr@auth.gr, STRÓZ, D.1
Zdroj: Journal of Microscopy. Oct2006, Vol. 224 Issue 1, p121-124. 4p.
Databáze: Academic Search Ultimate