Transmission electron microscopy analysis of phase separation in GaInAsSb films grown on GaSb substrate.
Autor: | SZCZESZEK, P.1, AMARIEI, A.1, SCHÖNE, J.1, ZOULIS, G.1, VOUROUTZIS, N.1, POLYCHRONIADIS, E. K. polychr@auth.gr, STRÓZ, D.1 |
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Zdroj: | Journal of Microscopy. Oct2006, Vol. 224 Issue 1, p121-124. 4p. |
Databáze: | Academic Search Ultimate |
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