Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review.
| Autor: | Mujeeb, A.1, Nayar, V. U.2, Ravindran, V. R.3 vr_ravindran@vssc.org |
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| Zdroj: | Insight: Non-Destructive Testing & Condition Monitoring. May2006, Vol. 48 Issue 5, p275-281. 7p. 10 Diagrams. |
| Databáze: | Academic Search Ultimate |
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