Physics of semiconductors and dielectrics the mechanism of formation and properties of stratified-inhomogeneity defects in silicon.
| Autor: | Kulinich, O.1 eltech@elaninet.com |
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| Zdroj: | Russian Physics Journal. Mar2006, Vol. 49 Issue 3, p233-238. 6p. 6 Black and White Photographs, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
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