Formation of polycrystalline SiGe thin films by the RF magnetron sputtering method with Ar–H2 mixture gases

Autor: Nakamura, Isao isaon@keyaki.cc.u-tokai.ac.jp, Ajiki, Toru1, Abe, Hirokazu1, Hoshi, Daisuke1, Isomura, Masao1
Zdroj: Vacuum. May2006, Vol. 80 Issue 7, p712-715. 4p.
Databáze: Academic Search Ultimate