Defect charge states for classical modeling of diffusion processes in insulators.
Autor: | Vail, John M.1 vail@cc.umanitoba.ca |
---|---|
Zdroj: | Radiation Effects & Defects in Solids. Aug2005, Vol. 160 Issue 8, p321-327. 7p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |