Mapping penetration of cosmetic compounds into hair fibers using time-of-flight secondary ion mass spectrometry (TOF-SIMS).
| Autor: | Hornby, S. B.1, Appa, Y.1, Ruetsch, S.2, Kamath, Y.2 |
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| Zdroj: | International Journal of Cosmetic Science. Oct2005, Vol. 27 Issue 5, p299-299. 1p. |
| Databáze: | Academic Search Ultimate |
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