Taguchi Method Statistical Analysis on Characterization and Optimization of 18-nm Double Gate MOSFETs.
| Autor: | Maheran, A.H. Afifah1 afifah@utem.edu.my, Pritigavane, M.1, Nizam, N. H. N. M.1, Salehuddin, F.1, Sabani, N.2 |
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| Zdroj: | International Journal of Nanoelectronics & Materials. Oct2024, Vol. 17 Issue 4, p549-555. 7p. |
| Databáze: | Academic Search Ultimate |
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