2023 JETTA-TTTC Best Paper Award: Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, and Theodore Manikas, "Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift," Journal of Electronic Testing: Theory and Applications, Volume 39, Number 2, pp. 227–243, April 2023

Zdroj: Journal of Electronic Testing. Oct2024, Vol. 40 Issue 5, p591-593. 3p.
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