Resonance Raman Scattering of Topological Insulators Bi2Te3 and Bi2 − xSbxTe3 − ySey Thin Films.

Autor: Kumar, N.1,2 (AUTHOR) kumar@isp.nsc.ru, Surovtsev, N. V.3 (AUTHOR), Ishchenko, D. V.1 (AUTHOR), Yunin, P. A.4,5 (AUTHOR), Milekhin, I. A.1,6 (AUTHOR), Tereshchenko, O. E.1,7 (AUTHOR), Milekhin, A. G.1,6 (AUTHOR)
Zdroj: Journal of Raman Spectroscopy. Nov2024, p1. 11p. 7 Illustrations.
Databáze: Academic Search Ultimate
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