Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface.

Autor: Cowie, Megan1 megan.cowie@mail.mcgill.ca, Constantinou, Procopios C.2, Curson, Neil J.2,3, Stock, Taylor J. Z.2,3, Grütter, Peter1
Zdroj: Proceedings of the National Academy of Sciences of the United States of America. 10/29/2024, Vol. 121 Issue 44, p1-8. 11p.
Databáze: Academic Search Ultimate