Standard Approaches to XPS and AES Quantification—A Summary of ISO 18118:2024 on the Use of Relative Sensitivity Factors.

Autor: Cant, David J. H.1 (AUTHOR) david.cant@npl.co.uk, Gorham, Justin M.2 (AUTHOR), Clifford, Charles A.1 (AUTHOR), Shard, Alexander G.1 (AUTHOR)
Zdroj: Surface & Interface Analysis: SIA. Nov2024, p1. 5p.
Databáze: Academic Search Ultimate
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