Effect of Growth Temperature on Strain during Growth and Crack Suppression in AlGaN Templates on Sapphire Substrates for Deep Ultraviolet Light‐Emitting Diodes.

Autor: Kachi, Tomoaki1 (AUTHOR), Takahata, Hayata1 (AUTHOR), Oka, Ryunosuke1 (AUTHOR), Ishiguro, Hisanori1 (AUTHOR), Takeuchi, Tetsuya1 (AUTHOR) take@meijo-u.ac.jp, Kamiyama, Satoshi1 (AUTHOR), Iwaya, Motoaki1 (AUTHOR), Saito, Yoshiki2 (AUTHOR), Okuno, Koji2 (AUTHOR)
Zdroj: Physica Status Solidi (B). Nov2024, Vol. 261 Issue 11, p1-9. 9p.
Databáze: Academic Search Ultimate