Impacts of single Shockley-type stacking faults on current conduction in 4H-SiC PiN diodes.
| Autor: | Asada, Satoshi1 (AUTHOR) asada3760@criepi.denken.or.jp, Murata, Koichi1 (AUTHOR), Tsuchida, Hidekazu1 (AUTHOR) |
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| Zdroj: | Journal of Applied Physics. 11/7/2024, Vol. 136 Issue 17, p1-8. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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