FOUR-DIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY: PART III, PTYCHOGRAPHY.
| Autor: | Johnston-Peck, Aaron C.1 aaron.johnston-peck@nist.gov, Herzing, Andrew A.1 |
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| Zdroj: | Electronic Device Failure Analysis. Nov2024, Vol. 26 Issue 4, p4-11. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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