Refractive index and thickness analysis of planar interfaces by prism coupling technique.
| Autor: | Lourenço, Paulo1,2 plourenco@deetc.isel.ipl.pt, Vygranenko, Yuri2, Fernandes, Miguel1,2, Fantoni, Alessandro1,2, Vieira, Manuela1,2,3 |
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| Zdroj: | EPJ Web of Conferences. 10/15/2024, Vol. 305, p1-4. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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