Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy.

Autor: Hoang, Le Phuong1,2,3 (AUTHOR), Spasojevic, Irena4 (AUTHOR), Lee, Tien-Lin5 (AUTHOR), Pesquera, David6 (AUTHOR), Rossnagel, Kai3,7 (AUTHOR), Zegenhagen, Jörg5 (AUTHOR), Catalan, Gustau6,8 (AUTHOR), Vartanyants, Ivan A.9 (AUTHOR), Scherz, Andreas1 (AUTHOR), Mercurio, Giuseppe1 (AUTHOR) giuseppe.mercurio@xfel.eu
Zdroj: Scientific Reports. 10/16/2024, Vol. 14 Issue 1, p1-19. 19p.
Databáze: Academic Search Ultimate
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