Atomic-level quantum well degradation of GaN-based laser diodes investigated by atom probe tomography.
| Autor: | Wen, Pengyan1,2 (AUTHOR), Xiu, Huixin3 (AUTHOR) huixin.xiu@usst.edu.cn, Zhang, Shuming4 (AUTHOR), Liu, Jianping4 (AUTHOR), Chen, Yimeng5 (AUTHOR), Yang, Hui4 (AUTHOR) |
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| Zdroj: | Journal of Applied Physics. 7/28/2024, Vol. 136 Issue 4, p1-7. 7p. |
| Databáze: | Academic Search Ultimate |
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