Deep learning-enabled probing of irradiation-induced defects in time-series micrographs.

Autor: Burns, Kory1 koryburns@virginia.edu, Tadj, Kayvon2, Allaparti, Tarun2,3, Arias, Liliana3,4, Li, Nan5, Aitkaliyeva, Assel6, Misra, Amit7, Scott, Mary C.2,8,9, Hattar, Khalid10 koryburns@virginia.edu
Zdroj: APL Machine Learning. Mar2024, Vol. 2 Issue 1, p1-10. 10p.
Databáze: Academic Search Ultimate
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