Gamma-Irradiation-Induced Electrical Characteristic Variations in MoS 2 Field-Effect Transistors with Buried Local Back-Gate Structure.
| Autor: | Kim, Su Jin1 (AUTHOR) sujink@kaeri.re.kr, Hwang, Seungkwon2 (AUTHOR) hhs0505@kims.re.kr, Kwon, Jung-Dae2 (AUTHOR), Yoon, Jongwon2 (AUTHOR), Park, Jeong Min1 (AUTHOR), Lee, Yongsu1 (AUTHOR), Kim, Yonghun2 (AUTHOR) kyhun09@kims.re.kr, Kang, Chang Goo1 (AUTHOR) kyhun09@kims.re.kr |
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| Zdroj: | Nanomaterials (2079-4991). Aug2024, Vol. 14 Issue 16, p1324. 10p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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