Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy.
| Autor: | Craig, Isaac M.1 (AUTHOR), Van Winkle, Madeline1 (AUTHOR), Ophus, Colin2 (AUTHOR), Bediako, D. Kwabena1,3 (AUTHOR) bediako@berkeley.edu |
|---|---|
| Zdroj: | Journal of Applied Physics. 8/21/2024, Vol. 136 Issue 7, p1-12. 12p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
|