Characterization of Nanocrystalline SnS Thin Film Fabricated used PLD Method for Photodetection Applications.
| Autor: | Kadhim, Suad M.1 Suad.M.Kadhim@uotechnology.edu.iq |
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| Zdroj: | International Journal of Nanoelectronics & Materials. Apr2024, Vol. 17 Issue 2, p172-179. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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