Toward Ideal Low‐Frequency Noise in Monolayer CVD MoS2 FETs: Influence of van der Waals Junctions and Sulfur Vacancy Management.

Autor: Shin, Wonjun1,2 (AUTHOR) swj0107@snu.ac.kr, Byeon, Junsung3 (AUTHOR), Koo, Ryun‐Han1 (AUTHOR), Lim, Jungmoon3 (AUTHOR), Kang, Jung Hyeon4 (AUTHOR), Jang, A‐Rang4 (AUTHOR), Lee, Jong‐Ho1,5 (AUTHOR), Kim, Jae‐Joon1 (AUTHOR), Cha, SeungNam3 (AUTHOR) chasn@skku.edu, Pak, Sangyeon6 (AUTHOR) spak@hongik.ac.kr, Lee, Sung‐Tae6 (AUTHOR) lst777@hongik.ac.kr
Zdroj: Advanced Science. 7/24/2024, Vol. 11 Issue 28, p1-12. 12p.
Databáze: Academic Search Ultimate
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