X-ray diffraction studies of GaAs implanted with 1.5MeV Se+ ions
| Autor: | Wierzchowski, Wojciech1 wierzc_w@itme.edu.pl, Wieteska, Krzysztof2, Graeff, Walter3, Turos, Andrzej1,4, Grötzschel, Reiner5 |
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| Zdroj: | Vacuum. May2005, Vol. 78 Issue 2-4, p569-575. 7p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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