Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy.

Autor: Mendoza‐Sánchez, Beatriz1 (AUTHOR) beatriz.sanchez.wa@gmail.com, Fernandez, Vincent2 (AUTHOR), Bargiela, Pascal3,4 (AUTHOR), Fairley, Neal5 (AUTHOR), Baltrusaitis, Jonas6 (AUTHOR) job314@lehigh.edu
Zdroj: Surface & Interface Analysis: SIA. Aug2024, Vol. 56 Issue 8, p525-531. 7p.
Databáze: Academic Search Ultimate
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