The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure.

Autor: Shen, Junquan1,2 (AUTHOR) sjq15167136560@163.com, Chen, Chin-Yin2 (AUTHOR) chenchinyin@nimte.ac.cn, Wu, Cheng-Yi3 (AUTHOR) nchengyiwu@txc.com.tw, Cheng, Jiguang3 (AUTHOR) njiguangcheng@txc.com.tw, Chao, Min-Chiang3 (AUTHOR) chaomk@txc.com.tw, Zhou, Qiang3 (AUTHOR) nqiangzhou@txc.com.tw, Lu, Congda1 (AUTHOR) LCD@zjut.edu.cn
Zdroj: Sensors (14248220). Jun2024, Vol. 24 Issue 11, p3359. 18p.
Databáze: Academic Search Ultimate
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