A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy.
| Autor: | De Angelis, Dario1,2 deangelis@iom.cnr.it, Longetti, Luca3,4 luca.longetti@psi.ch, Bonano, Gabriele5,6 gabriele.bonano@unimore.it, Pelli Cresi, Jacopo Stefano1, Foglia, Laura1, Pancaldi, Matteo1, Capotondi, Flavio1, Pedersoli, Emanuele1, Bencivenga, Filippo1, Krstulovic, Marija1, Menk, Ralf Hendrik1,7,8, D'Addato, Sergio5, Orlando, Stefano6, de Simone, Monica2,7, Ingle, Rebecca A.9, Bleiner, Davide10, Coreno, Marcello1,6, Principi, Emiliano1, Chergui, Majed1,3, Masciovecchio, Claudio1 |
|---|---|
| Zdroj: | Journal of Synchrotron Radiation. May2024, Vol. 31 Issue 3, p605-612. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
|