A Defects Classification Algorithm for the Hybrid OBT–IDDQ Fault Diagnosis Technique in Analog CMOS Integrated Circuits.
| Autor: | Mirkovic, Dejan D.1 (AUTHOR) dejan.mirkovic@elfak.ni.ac.rs, Mirkovic, Milena J. Stanojlovic1 (AUTHOR) milena.stanojlovic.mirkovic@elfak.ni.ac.rs, Milic, Miljana L. J.1 (AUTHOR) miljana.milic@elfak.ni.ac.rs, Petrovic, Vladimir Z.2 (AUTHOR) v-petrovic@hdl-dh.com |
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| Zdroj: | Journal of Circuits, Systems & Computers. 6/1/2024, Vol. 33 Issue 9, p1-36. 36p. |
| Databáze: | Academic Search Ultimate |
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