Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy.
| Autor: | Jena, S.1 (AUTHOR) sanjuktajena@cusb.ac.in, Urkude, R.2 (AUTHOR), Choi, W.-Y.3 (AUTHOR), Pandey, K. K.4,5 (AUTHOR), Karwal, S.6 (AUTHOR), Jung, M. H.3 (AUTHOR), Gardner, J.7 (AUTHOR), Ghosh, B.2 (AUTHOR), Singh, V. R.1 (AUTHOR) vijayraj@cusb.ac.in |
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| Zdroj: | Journal of Applied Physics. 4/28/2024, Vol. 135 Issue 16, p1-10. 10p. |
| Databáze: | Academic Search Ultimate |
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