Thickness-dependent electronic relaxation dynamics in solution-phase redox-exfoliated MoS2 heterostructures.
Autor: | Jeffries, William R.1 (AUTHOR), Jawaid, Ali M.2 (AUTHOR), Vaia, Richard A.2 (AUTHOR), Knappenberger Jr., Kenneth L.1 (AUTHOR) klk260@psu.edu |
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Zdroj: | Journal of Chemical Physics. 4/14/2024, Vol. 160 Issue 14, p1-10. 10p. |
Databáze: | Academic Search Ultimate |
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