Thickness-dependent electronic relaxation dynamics in solution-phase redox-exfoliated MoS2 heterostructures.

Autor: Jeffries, William R.1 (AUTHOR), Jawaid, Ali M.2 (AUTHOR), Vaia, Richard A.2 (AUTHOR), Knappenberger Jr., Kenneth L.1 (AUTHOR) klk260@psu.edu
Zdroj: Journal of Chemical Physics. 4/14/2024, Vol. 160 Issue 14, p1-10. 10p.
Databáze: Academic Search Ultimate