Observation of broad triangular Frank-type stacking faults and characterization of stacking faults with emission wavelengths below 430 nm in 4H–SiC epitaxial layers.
| Autor: | Na, Moonkyong1 (AUTHOR) nmk@keri.re.kr, Bahng, Wook2 (AUTHOR), Jung, Hyundon3 (AUTHOR), Oh, Chanhyoung3 (AUTHOR), Jang, Donghyun3 (AUTHOR), Hong, Soon-Ku4 (AUTHOR) soonku@cnu.ac.kr |
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| Zdroj: | Applied Physics Letters. 4/8/2024, Vol. 124 Issue 15, p1-8. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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