In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy.
| Autor: | Lotze, Gudrun1,2, Iyer, Anand H. S.3, Bäcke, Olof3, Kalbfleisch, Sebastian1, Colliander, Magnus Hörnqvist3 magnus.colliander@chalmers.se |
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| Zdroj: | Journal of Synchrotron Radiation. Jan2024, Vol. 31 Issue 1, p42-54. 13p. |
| Databáze: | Academic Search Ultimate |
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